REWIRE Transforming Next-Gen Power Electronics Webinar Series – #3 Scanning probe microscopy for insights into the electrical properties of wide band gap semiconductors

REWIRE Webinar Series 2025

#3 Scanning probe microscopy for insights into the electrical properties of wide band gap semiconductors – please register for the webinar

This is the third webinar in our ongoing REWIRE series focusing on all things power semiconductors and next-generation power electronics.

Our August Webinar will be co-presented by Dr. Peter De Wolf, Application Director – Nano Surfaces Business at Bruker Nano Surfaces & Metrology and Mr. Chen Chen, PhD student at the University of Cambridge. Join us for a thought-provoking and engaging session as they discuss:

• Bruker’s world-leading capabilities in scanning probe microscopy and their ongoing collaboration with REWIRE academics at the University of Cambridge
• how scanning probe microscopy can be harnessed to measure properties of semiconductor materials and devices
• the benefits of industry-academia collaboration in the development of novel electrical characterisaton and measurement methods for wide bandgap electronic devices

There will be opportunities to quiz our speakers during the Q&A at the end of the session. Please note the webinar will be recorded but the Q&A function is only available live.

Email the REWIRE mailbox (rewire-ikc@bristol.ac.uk) or Alex Oliver (alex.oliver@bristol.ac.uk) if you have any enquiries.